Contact Info
Adam P. Hitchcock
Canada Research Chair
in Materials Research
CLS-CCRS
B.I.M.R
McMaster University
Hamilton, ON
Canada L8S 4M1
V: +1 905 525-9140
    x24729
F: +1 905 521-2773
E: aph@mcmaster.ca
U: unicorn.mcmaster.ca
__________

Structural studies by EXAFS

• Z.H. Lu, T. Tyliszczak, A.P. Hitchcock and M.W.C. Dharma-wardana, Structure of the Cl-passivated Ge(111) surface determined using X-ray absorption and first principles calculations, Surface Science 442 (1999) L948-952.  get pdf
• Z.H. Lu, T. Tyliszczak, P. Brodersen, A.P. Hitchcock, J.B. Webb, H. Tang, and J.  Bardwell,  Local microstructures of Si in GaN studied by X-ray absorption spectroscopy,  Appl. Phys. Lett.75 (1999) 534-538.
•  J.C. Aubry, T. Tyliszczak, A.P. Hitchcock, J.-M. Baribeau and T.E. Jackman, First shell bond lengths in SixGe1-x single crystal alloys, Phys. Rev. B 59 (1999) 12872-12883.
• Z.H. Lu, T.Tyliszczak and A.P. Hitchcock, Structure of the Cl-passivated GaAs(111) surface, Phys. Rev. B  58 (1998) 13820-13823.
• S. Wu, Z. Shi, J. Lipkowski, A.P. Hitchcock and T. Tyliszczak, Early Stages of Copper Electrocrystallisation: Electrochemical and in situ X-ray Absorption Fine Structure Studies of Coadsorption of Copper and Chloride at the Au(111) Electrode Surface,  J. Phys. Chem. B 101 (1997) 10310-10320.
• E. Rühl, A. Knop, A.P. Hitchcock, P.A. Dowben and D.N. McIlroy, Core Excitation in Free Clusters: Ionization, Relaxation and Fragmentation, Surface Reviews and Letters 3 (1996) 557-565.
• A.P. Hitchcock and T. Tyliszczak, Surface studies by core-excitation reflection electron energy loss spectroscopy, Surface Reviews and Letters 2 (1995) 43-61.
• E. Rühl, A.P. Hitchcock, P. Morin and M. Lavollée, Core Excitation in Atomic and Molecular Clusters, Journal de Chimie et Physique 92 (1995) 521-534.
• T. Tyliszczak, A.P. Hitchcock, Z.H. Lu, J-M. Baribeau and T.E. Jackman, X-ray Absorption Studies of strain in epitaxial (Si-Ge) atomic layer superlattices and alloy films, Scanning Microscopy 8 (1994) 795-802
• A.P. Hitchcock, T.Tyliszczak, M.L.M. Rocco, J.T. Francis, S.G. Urquhart, Z.H. Feng, Z.H. Lu, J.M. Baribeau and T.E. Jackman, Polarization Dependence of the Si 1s X-ray Absorption Spectra of Single Crystal Si-Ge Alloys and Atomic Layer Superlattices, J. Vac. Sci. Tech. A 12 (1994) 1142-1147.
• A.P. Hitchcock, T.Tyliszczak, P. Aebi, X.H. Feng, Z.H. Lu, J.M. Baribeau and T.E. Jackman, Polarization Dependence of the Si 1s X-ray Absorption Spectra of Si-Ge Atomic Layer Superlattices, Surf. Sci. 301 (1994) 260-272.

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web site by Christopher Amis. Last updated on 24 Sep 2008 (aph)