Contact Info

Adam P. Hitchcock

Canada Research Chair

in Materials Research
CLS-CCRS
B.I.M.R
McMaster University
Hamilton, ON
Canada L8S 4M1
V: +1 905 525-9140
    x24729
F: +1 905 521-2773
E: aph@mcmaster.ca
U: unicorn.mcmaster.ca
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Peter Brodersen

B.Sc. (Queen's); M.Sc. (Queen's)

Location: ABB 332

E-mail     broderpm@mcmaster.ca

Phone:   +1 905 525-9140 ext. 24864

FAX:      +1 905 521-2773

RESEARCH: Semiconductor surface passivation by in-situ and ex-situ techniques is studied by a combination of synchrotron methods (X-ray absorption (XANES, EXAFS) and X-ray standing wave) and lab-based UHV methods (LEED, Auger, thermal desorption).

Since 15-Feb-02, I am working as a staff scientist with the Interface and Surface Analysis group at the University of Toronto. I hope to defend my PhD by the end of this year.

© 2002 A.P. Hitchcock / McMaster University - All Rights Reserved
web site by Christopher Amis. Last updated on 22-Aug-2002 (aph)