J. Electron Spectroscopy 150 (2005) 86-104

Soft X-ray Microscopy and Spectroscopy at the Molecular Environmental Science Beamline at the Advanced Light Source

H. Bluhm, K. Andersson, T. Araki, K. Benzerara, G.E. Brown, J.J. Dynes, S. Ghosal, M.K. Gilles, H.-Ch. Hansen, J.C. Hemminger, A.P. Hitchcock, G. Ketteler, E. Kneedler, J.R. Lawrence, G.G. Leppard, J. Majzlam, B.S. Mun, S.C.B. Myneni, A. Nilsson, H. Ogasawara, D.F. Ogletree, K. Pecher, M. Salmeron, B. Tonner, T. Tyliszczak, T.H. Yoon and D.K. Shuh


We present examples of the application of synchrotron-based spectroscopies and microscopies to environmentally relevant samples. The experiments were performed at the molecular environmental science beamline (11.0.2) at the Advanced Light Source, Lawrence Berkeley National Laboratory. Examples range from the study of water monolayers on Pt(1 1 1) single crystal surfaces using X-ray emission spectroscopy and the examination of alkali halide solution/water vapor interfaces using ambient pressure photoemission spectroscopy, to the investigation of actinides, river water biofilms, Al-containing colloids and mineral–bacteria suspensions using scanning transmission X-ray spectromicroscopy. The results of our experiments show that spectroscopy and microscopy in the soft X-ray energy range are excellent tools for the investigation of environmentally relevant samples under realistic conditions, i.e., with water or water vapor present at ambient temperature.

Keywords: Keywords: X-ray photoelectron spectroscopy; Scanning transmission X-ray microscopy; X-ray emission spectroscopy; Near-edge X-ray absorption fine structure; Water environmental science

© 2005 Elsevier B.V. All rights reserved.