Chemical Physics 257 (2000) 235-252.

Generalized oscillator strengths for inner-shell excitation of SF6 recorded with a high-performance electron energy loss spectrometer

I. G. Eustatiu1, J. T. Francis2, T. Tyliszczak2, C. C. Turci3, A. L. D. Kilcoyne4 and A. P. Hitchcock2

1. Department of Physics and Astronomy, McMaster University, ON, L8S 4M1, Canada

2. Department of Chemistry, McMaster University, Hamilton, ON, L8S 4M1, Canada

3. Instituto de Química, Universidade Federal do Rio de Janeiro, 21910-900 Rio de Janeiro, Brazil

4. Department of Physics, North Carolina State University, Raleigh, NC, USA

(Received 4 Mar 2000)



       The generalized oscillator strength (GOS) profiles for S 2p, S 2s and F 1s excited and ionized states of SF6 are reported up to very high momentum transfer. These have been measured with a variable impact energy, variable scattering angle electron energy loss spectrometer which is dedicated to studies of electric dipole (optically allowed) and non-dipole (optically forbidden electric quadrupole and spin-exchange) inner shell electronic transitions of gases, and systematic measurements of their angular and impact energy distributions in order to derive generalized oscillator strength profiles. In addition to presenting the SF6 results, we describe the design, construction and performance of the instrument, as well as data acquisition and analysis procedures.

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